Programme

9:00 Accueil café
9:30 Moncef KADI ESIGELEC-IRSEEM Présentation du réseau électronique
9:45 Jean-Baptiste FONDER CEVAA Présentation du consortium FISYCOM
10:00 Philippe GALY ST-Microelectronics Electro Static Discharge (ESD) from Electron to SOC solutions in Bulk & UTBB FDSOI advanced CMOS technologies
10:45 Frédéric LAFON VALEO ESD behavioral modelling methodology and application for product design at VALEO
11:30 Olivier LATRY GPM/Univ de Rouen 4H-SiC Schottky diodes under ESD like human body model stresses: A failure analysis method
13:45 Nicolas GUITARD ST-Microelectronics EOS : un-standardized aggressor at the origin of many returns from the field
14:30 François FOUQUET ESIGELEC-IRSEEM Electrical Overstress : Test methodology and result analysis
15:15 Bernadette DOMENGES LAMIPS Physical failure analyses : a key to understanding failures due to Over Voltage Stress

 

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