| 9:00 | Accueil café | ||
| 9:30 | Moncef KADI | ESIGELEC-IRSEEM | Présentation du réseau électronique |
| 9:45 | Jean-Baptiste FONDER | CEVAA | Présentation du consortium FISYCOM |
| 10:00 | Philippe GALY | ST-Microelectronics | Electro Static Discharge (ESD) from Electron to SOC solutions in Bulk & UTBB FDSOI advanced CMOS technologies |
| 10:45 | Frédéric LAFON | VALEO | ESD behavioral modelling methodology and application for product design at VALEO |
| 11:30 | Olivier LATRY | GPM/Univ de Rouen | 4H-SiC Schottky diodes under ESD like human body model stresses: A failure analysis method |
| 13:45 | Nicolas GUITARD | ST-Microelectronics | EOS : un-standardized aggressor at the origin of many returns from the field |
| 14:30 | François FOUQUET | ESIGELEC-IRSEEM | Electrical Overstress : Test methodology and result analysis |
| 15:15 | Bernadette DOMENGES | LAMIPS | Physical failure analyses : a key to understanding failures due to Over Voltage Stress |
